Adaptive Control of Ion Yield in Femtosecond Laser Post-ionization for Secondary Ion Mass Spectrometry

Secondary ion mass spectrometry is an excellent technique of analytical chemistry, where primary ions sputter a solid sample generating the secondary ions which are determined. Although the ion yield is inherently low, it can be enhanced by using a post-ionization of sputtered neutral species. Our n...

Descripción completa

Detalles Bibliográficos
Autores principales: Lorenc, Dusan, Jerigova, Monika, Stupavska, Monika, Velic, Dusan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5519762/
https://www.ncbi.nlm.nih.gov/pubmed/28729560
http://dx.doi.org/10.1038/s41598-017-06562-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5519762/
https://www.ncbi.nlm.nih.gov/pubmed/28729560
http://dx.doi.org/10.1038/s41598-017-06562-9

Ejemplares similares