Ti-doped ZnO Thin Films Prepared at Different Ambient Conditions: Electronic Structures and Magnetic Properties

We present a comprehensive study on Ti-doped ZnO thin films using X-ray Absorption Fine Structure (XAFS) spectroscopy. Ti K edge XAFS spectra were measured to study the electronic and chemical properties of Ti ions in the thin films grown under different ambient atmospheres. A strong dependence of T...

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Detalles Bibliográficos
Autores principales: Yong, Zhihua, Liu, Tao, Uruga, Tomoya, Tanida, Hajime, Qi, Dongchen, Rusydi, Andrivo, Wee, Andrew T. S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2010
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5521751/
http://dx.doi.org/10.3390/ma3063642

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5521751/
http://dx.doi.org/10.3390/ma3063642

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