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Porous Dielectrics in Microelectronic Wiring Applications
Porous insulators are utilized in the wiring structure of microelectronic devices as a means of reducing, through low dielectric permittivity, power consumption and signal delay in integrated circuits. They are typically based on low density modifications of amorphous SiO(2) known as SiCOH or carbon...
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Formato: | Online Artículo Texto |
Lenguaje: | English |
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Molecular Diversity Preservation International
2010
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5525179/ http://dx.doi.org/10.3390/ma3010536 |
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author | McGahay, Vincent |
author_facet | McGahay, Vincent |
author_sort | McGahay, Vincent |
collection | PubMed |
description | Porous insulators are utilized in the wiring structure of microelectronic devices as a means of reducing, through low dielectric permittivity, power consumption and signal delay in integrated circuits. They are typically based on low density modifications of amorphous SiO(2) known as SiCOH or carbon-doped oxides, in which free volume is created through the removal of labile organic phases. Porous dielectrics pose a number of technological challenges related to chemical and mechanical stability, particularly in regard to semiconductor processing methods. This review discusses porous dielectric film preparation techniques, key issues encountered, and mitigation strategies. |
format | Online Article Text |
id | pubmed-5525179 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2010 |
publisher | Molecular Diversity Preservation International |
record_format | MEDLINE/PubMed |
spelling | pubmed-55251792017-07-28 Porous Dielectrics in Microelectronic Wiring Applications McGahay, Vincent Materials (Basel) Review Porous insulators are utilized in the wiring structure of microelectronic devices as a means of reducing, through low dielectric permittivity, power consumption and signal delay in integrated circuits. They are typically based on low density modifications of amorphous SiO(2) known as SiCOH or carbon-doped oxides, in which free volume is created through the removal of labile organic phases. Porous dielectrics pose a number of technological challenges related to chemical and mechanical stability, particularly in regard to semiconductor processing methods. This review discusses porous dielectric film preparation techniques, key issues encountered, and mitigation strategies. Molecular Diversity Preservation International 2010-01-18 /pmc/articles/PMC5525179/ http://dx.doi.org/10.3390/ma3010536 Text en © 2010 by the authors; licensee Molecular Diversity Preservation International, Basel, Switzerland. This article is an open-access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/). |
spellingShingle | Review McGahay, Vincent Porous Dielectrics in Microelectronic Wiring Applications |
title | Porous Dielectrics in Microelectronic Wiring Applications |
title_full | Porous Dielectrics in Microelectronic Wiring Applications |
title_fullStr | Porous Dielectrics in Microelectronic Wiring Applications |
title_full_unstemmed | Porous Dielectrics in Microelectronic Wiring Applications |
title_short | Porous Dielectrics in Microelectronic Wiring Applications |
title_sort | porous dielectrics in microelectronic wiring applications |
topic | Review |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5525179/ http://dx.doi.org/10.3390/ma3010536 |
work_keys_str_mv | AT mcgahayvincent porousdielectricsinmicroelectronicwiringapplications |