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Porous Dielectrics in Microelectronic Wiring Applications

Porous insulators are utilized in the wiring structure of microelectronic devices as a means of reducing, through low dielectric permittivity, power consumption and signal delay in integrated circuits. They are typically based on low density modifications of amorphous SiO(2) known as SiCOH or carbon...

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Detalles Bibliográficos
Autor principal: McGahay, Vincent
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International 2010
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5525179/
http://dx.doi.org/10.3390/ma3010536
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author McGahay, Vincent
author_facet McGahay, Vincent
author_sort McGahay, Vincent
collection PubMed
description Porous insulators are utilized in the wiring structure of microelectronic devices as a means of reducing, through low dielectric permittivity, power consumption and signal delay in integrated circuits. They are typically based on low density modifications of amorphous SiO(2) known as SiCOH or carbon-doped oxides, in which free volume is created through the removal of labile organic phases. Porous dielectrics pose a number of technological challenges related to chemical and mechanical stability, particularly in regard to semiconductor processing methods. This review discusses porous dielectric film preparation techniques, key issues encountered, and mitigation strategies.
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spelling pubmed-55251792017-07-28 Porous Dielectrics in Microelectronic Wiring Applications McGahay, Vincent Materials (Basel) Review Porous insulators are utilized in the wiring structure of microelectronic devices as a means of reducing, through low dielectric permittivity, power consumption and signal delay in integrated circuits. They are typically based on low density modifications of amorphous SiO(2) known as SiCOH or carbon-doped oxides, in which free volume is created through the removal of labile organic phases. Porous dielectrics pose a number of technological challenges related to chemical and mechanical stability, particularly in regard to semiconductor processing methods. This review discusses porous dielectric film preparation techniques, key issues encountered, and mitigation strategies. Molecular Diversity Preservation International 2010-01-18 /pmc/articles/PMC5525179/ http://dx.doi.org/10.3390/ma3010536 Text en © 2010 by the authors; licensee Molecular Diversity Preservation International, Basel, Switzerland. This article is an open-access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Review
McGahay, Vincent
Porous Dielectrics in Microelectronic Wiring Applications
title Porous Dielectrics in Microelectronic Wiring Applications
title_full Porous Dielectrics in Microelectronic Wiring Applications
title_fullStr Porous Dielectrics in Microelectronic Wiring Applications
title_full_unstemmed Porous Dielectrics in Microelectronic Wiring Applications
title_short Porous Dielectrics in Microelectronic Wiring Applications
title_sort porous dielectrics in microelectronic wiring applications
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5525179/
http://dx.doi.org/10.3390/ma3010536
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