Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe(17+) ions

Secondary electron emission yield from the surface of SiC ceramics induced by Xe(17+) ions has been measured as a function of target temperature and incident energy. In the temperature range of 463–659 K, the total yield gradually decreases with increasing target temperature. The decrease is about 5...

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Detalles Bibliográficos
Autores principales: Zeng, Lixia, Zhou, Xianming, Cheng, Rui, Wang, Xing, Ren, Jieru, Lei, Yu, Ma, Lidong, Zhao, Yongtao, Zhang, Xiaoan, Xu, Zhongfeng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5526893/
https://www.ncbi.nlm.nih.gov/pubmed/28743901
http://dx.doi.org/10.1038/s41598-017-06891-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5526893/
https://www.ncbi.nlm.nih.gov/pubmed/28743901
http://dx.doi.org/10.1038/s41598-017-06891-9

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