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Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe(17+) ions
Secondary electron emission yield from the surface of SiC ceramics induced by Xe(17+) ions has been measured as a function of target temperature and incident energy. In the temperature range of 463–659 K, the total yield gradually decreases with increasing target temperature. The decrease is about 5...
| Autores principales: | , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5526893/ https://www.ncbi.nlm.nih.gov/pubmed/28743901 http://dx.doi.org/10.1038/s41598-017-06891-9 |