Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity

In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional, indirect detection sensors for electron microscopy applications. Direct detection technology has previously been utilized, with great success, fo...

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Detalles Bibliográficos
Autores principales: Hart, James L., Lang, Andrew C., Leff, Asher C., Longo, Paolo, Trevor, Colin, Twesten, Ray D., Taheri, Mitra L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5557959/
https://www.ncbi.nlm.nih.gov/pubmed/28811485
http://dx.doi.org/10.1038/s41598-017-07709-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5557959/
https://www.ncbi.nlm.nih.gov/pubmed/28811485
http://dx.doi.org/10.1038/s41598-017-07709-4

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