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Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity

In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional, indirect detection sensors for electron microscopy applications. Direct detection technology has previously been utilized, with great success, fo...

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Autores principales: Hart, James L., Lang, Andrew C., Leff, Asher C., Longo, Paolo, Trevor, Colin, Twesten, Ray D., Taheri, Mitra L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5557959/
https://www.ncbi.nlm.nih.gov/pubmed/28811485
http://dx.doi.org/10.1038/s41598-017-07709-4
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author Hart, James L.
Lang, Andrew C.
Leff, Asher C.
Longo, Paolo
Trevor, Colin
Twesten, Ray D.
Taheri, Mitra L.
author_facet Hart, James L.
Lang, Andrew C.
Leff, Asher C.
Longo, Paolo
Trevor, Colin
Twesten, Ray D.
Taheri, Mitra L.
author_sort Hart, James L.
collection PubMed
description In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional, indirect detection sensors for electron microscopy applications. Direct detection technology has previously been utilized, with great success, for imaging and diffraction, but potential advantages for spectroscopy remain unexplored. Here we compare the performance of a direct detection sensor operated in counting mode and an indirect detection sensor (scintillator/fiber-optic/CCD) for electron energy-loss spectroscopy. Clear improvements in measured detective quantum efficiency and combined energy resolution/energy field-of-view are offered by counting mode direct detection, showing promise for efficient spectrum imaging, low-dose mapping of beam-sensitive specimens, trace element analysis, and time-resolved spectroscopy. Despite the limited counting rate imposed by the readout electronics, we show that both core-loss and low-loss spectral acquisition are practical. These developments will benefit biologists, chemists, physicists, and materials scientists alike.
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spelling pubmed-55579592017-08-18 Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity Hart, James L. Lang, Andrew C. Leff, Asher C. Longo, Paolo Trevor, Colin Twesten, Ray D. Taheri, Mitra L. Sci Rep Article In many cases, electron counting with direct detection sensors offers improved resolution, lower noise, and higher pixel density compared to conventional, indirect detection sensors for electron microscopy applications. Direct detection technology has previously been utilized, with great success, for imaging and diffraction, but potential advantages for spectroscopy remain unexplored. Here we compare the performance of a direct detection sensor operated in counting mode and an indirect detection sensor (scintillator/fiber-optic/CCD) for electron energy-loss spectroscopy. Clear improvements in measured detective quantum efficiency and combined energy resolution/energy field-of-view are offered by counting mode direct detection, showing promise for efficient spectrum imaging, low-dose mapping of beam-sensitive specimens, trace element analysis, and time-resolved spectroscopy. Despite the limited counting rate imposed by the readout electronics, we show that both core-loss and low-loss spectral acquisition are practical. These developments will benefit biologists, chemists, physicists, and materials scientists alike. Nature Publishing Group UK 2017-08-15 /pmc/articles/PMC5557959/ /pubmed/28811485 http://dx.doi.org/10.1038/s41598-017-07709-4 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Hart, James L.
Lang, Andrew C.
Leff, Asher C.
Longo, Paolo
Trevor, Colin
Twesten, Ray D.
Taheri, Mitra L.
Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
title Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
title_full Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
title_fullStr Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
title_full_unstemmed Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
title_short Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
title_sort direct detection electron energy-loss spectroscopy: a method to push the limits of resolution and sensitivity
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5557959/
https://www.ncbi.nlm.nih.gov/pubmed/28811485
http://dx.doi.org/10.1038/s41598-017-07709-4
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