Characterization and Mapping of Leaf Rust and Stripe Rust Resistance Loci in Hexaploid Wheat Lines UC1110 and PI610750 under Mexican Environments

Growing resistant wheat varieties is a key method of minimizing the extent of yield losses caused by the globally important wheat leaf rust (LR) and stripe rust (YR) diseases. In this study, a population of 186 F(8) recombinant inbred lines (RILs) derived from a cross between a synthetic wheat deriv...

Descripción completa

Detalles Bibliográficos
Autores principales: Lan, Caixia, Hale, Iago L., Herrera-Foessel, Sybil A., Basnet, Bhoja R., Randhawa, Mandeep S., Huerta-Espino, Julio, Dubcovsky, Jorge, Singh, Ravi P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2017
Materias:
Plant Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5573434/
https://www.ncbi.nlm.nih.gov/pubmed/28878791
http://dx.doi.org/10.3389/fpls.2017.01450

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5573434/
https://www.ncbi.nlm.nih.gov/pubmed/28878791
http://dx.doi.org/10.3389/fpls.2017.01450

Ejemplares similares