Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope

Nowadays Field Emission Gun-Scanning Electron Microscopes provide detailed crystallographic information with high spatial and angular resolutions, and allow direct observation of crystalline defects, such as dislocations, through an attractive technique called Electron Channeling Contrast Imaging (E...

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Detalles Bibliográficos
Autores principales: Kriaa, H., Guitton, A., Maloufi, N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5575337/
https://www.ncbi.nlm.nih.gov/pubmed/28851960
http://dx.doi.org/10.1038/s41598-017-09756-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5575337/
https://www.ncbi.nlm.nih.gov/pubmed/28851960
http://dx.doi.org/10.1038/s41598-017-09756-3

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