Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials

The important role of surface sensitive characterization techniques such as Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS), time of flight scanning ion mass spectrometry (TOF-SIMS) and High resolution transmission electron microscopy (HRTEM) for the characterization of di...

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Detalles Bibliográficos
Autor principal: Swart, Hendrik C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5578272/
https://www.ncbi.nlm.nih.gov/pubmed/28777357
http://dx.doi.org/10.3390/ma10080906

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5578272/
https://www.ncbi.nlm.nih.gov/pubmed/28777357
http://dx.doi.org/10.3390/ma10080906

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