Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials

The important role of surface sensitive characterization techniques such as Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS), time of flight scanning ion mass spectrometry (TOF-SIMS) and High resolution transmission electron microscopy (HRTEM) for the characterization of different phosphor materials is discussed in this short review by giving selective examples from previous obtained results. AES is used to monitor surface reactions during electron bombardment and also to determine the elemental composition of the surfaces of the materials, while XPS and TOF-SIMS are used for determining the surface chemical composition and valence state of the dopants. The role of XPS to determine the presence of defects in the phosphor matrix is also stated with the different examples. The role of HRTEM in combination with Energy dispersive spectroscopy (EDS) for nanoparticle characterization is also pointed out.