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Surface Sensitive Techniques for Advanced Characterization of Luminescent Materials
The important role of surface sensitive characterization techniques such as Auger electron spectroscopy (AES), X-ray photo electron spectroscopy (XPS), time of flight scanning ion mass spectrometry (TOF-SIMS) and High resolution transmission electron microscopy (HRTEM) for the characterization of di...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2017
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5578272/ https://www.ncbi.nlm.nih.gov/pubmed/28777357 http://dx.doi.org/10.3390/ma10080906 |