Nanometric Integrated Temperature and Thermal Sensors in CMOS-SOI Technology

This paper reviews and compares the thermal and noise characterization of CMOS (complementary metal-oxide-semiconductor) SOI (Silicon on insulator) transistors and lateral diodes used as temperature and thermal sensors. DC analysis of the measured sensors and the experimental results in a broad (300...

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Detalles Bibliográficos
Autores principales: Malits, Maria, Nemirovsky, Yael
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5579748/
https://www.ncbi.nlm.nih.gov/pubmed/28758932
http://dx.doi.org/10.3390/s17081739

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5579748/
https://www.ncbi.nlm.nih.gov/pubmed/28758932
http://dx.doi.org/10.3390/s17081739

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