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Evaluation of preparation methods for suspended nano-objects on substrates for dimensional measurements by atomic force microscopy
Dimensional measurements on nano-objects by atomic force microscopy (AFM) require samples of safely fixed and well individualized particles with a suitable surface-specific particle number on flat and clean substrates. Several known and proven particle preparation methods, i.e., membrane filtration,...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5588544/ https://www.ncbi.nlm.nih.gov/pubmed/28904839 http://dx.doi.org/10.3762/bjnano.8.179 |