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Evaluation of preparation methods for suspended nano-objects on substrates for dimensional measurements by atomic force microscopy

Dimensional measurements on nano-objects by atomic force microscopy (AFM) require samples of safely fixed and well individualized particles with a suitable surface-specific particle number on flat and clean substrates. Several known and proven particle preparation methods, i.e., membrane filtration,...

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Detalles Bibliográficos
Autores principales:	Fiala, Petra, Göhler, Daniel, Wessely, Benno, Stintz, Michael, Lazzerini, Giovanni Mattia, Yacoot, Andrew
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2017
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5588544/ https://www.ncbi.nlm.nih.gov/pubmed/28904839 http://dx.doi.org/10.3762/bjnano.8.179

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