Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction

Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron backscatter...

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Detalles Bibliográficos
Autores principales: Naresh-Kumar, G., Vilalta-Clemente, A., Jussila, H., Winkelmann, A., Nolze, G., Vespucci, S., Nagarajan, S., Wilkinson, A. J., Trager-Cowan, C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5589861/
https://www.ncbi.nlm.nih.gov/pubmed/28883500
http://dx.doi.org/10.1038/s41598-017-11187-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5589861/
https://www.ncbi.nlm.nih.gov/pubmed/28883500
http://dx.doi.org/10.1038/s41598-017-11187-z

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