Cargando…

Electron beam detection of a Nanotube Scanning Force Microscope

Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM forced the introduction of a new class of resonators with dimensions at t...

Descripción completa

Detalles Bibliográficos
Autores principales: Siria, Alessandro, Niguès, Antoine
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5599590/
https://www.ncbi.nlm.nih.gov/pubmed/28912433
http://dx.doi.org/10.1038/s41598-017-11749-1