Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level

Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicological risk assessment and drug discovery. In particular, time-of-flight secondary ion mass spectrometry (ToF-SIMS) with its high spatial and depth resolution is becoming part of the imaging mass spect...

Descripción completa

Detalles Bibliográficos
Autores principales: Jungnickel, Harald, Laux, Peter, Luch, Andreas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2016
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5606633/
https://www.ncbi.nlm.nih.gov/pubmed/29051411
http://dx.doi.org/10.3390/toxics4010005

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5606633/
https://www.ncbi.nlm.nih.gov/pubmed/29051411
http://dx.doi.org/10.3390/toxics4010005

Ejemplares similares