Measuring the Pull-Off Force of an Individual Fiber Using a Novel Picoindenter/Scanning Electron Microscope Technique

We employed a novel picoindenter (PI)/scanning electron microscopy (SEM) technique to measure the pull-off force of an individual electrospun poly(vinylidene fluoride) (PVDF) fibers. Individual fibers were deposited over a channel in a custom-designed silicon substrate, which was then attached to a...

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Detalles Bibliográficos
Autores principales: Sahay, Rahul, Radchenko, Ihor, Budiman, Arief S., Baji, Avinash
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5615728/
https://www.ncbi.nlm.nih.gov/pubmed/28902168
http://dx.doi.org/10.3390/ma10091074

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5615728/
https://www.ncbi.nlm.nih.gov/pubmed/28902168
http://dx.doi.org/10.3390/ma10091074

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