Imaging Atomic Scale Dynamics on III–V Nanowire Surfaces During Electrical Operation

As semiconductor electronics keep shrinking, functionality depends on individual atomic scale surface and interface features that may change as voltages are applied. In this work we demonstrate a novel device platform that allows scanning tunneling microscopy (STM) imaging with atomic scale resoluti...

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Detalles Bibliográficos
Autores principales: Webb, J. L., Knutsson, J., Hjort, M., McKibbin, S. R., Lehmann, S., Thelander, C., Dick, K. A., Timm, R., Mikkelsen, A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5630597/
https://www.ncbi.nlm.nih.gov/pubmed/28986546
http://dx.doi.org/10.1038/s41598-017-13007-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5630597/
https://www.ncbi.nlm.nih.gov/pubmed/28986546
http://dx.doi.org/10.1038/s41598-017-13007-w

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