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Imaging Atomic Scale Dynamics on III–V Nanowire Surfaces During Electrical Operation
As semiconductor electronics keep shrinking, functionality depends on individual atomic scale surface and interface features that may change as voltages are applied. In this work we demonstrate a novel device platform that allows scanning tunneling microscopy (STM) imaging with atomic scale resoluti...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5630597/ https://www.ncbi.nlm.nih.gov/pubmed/28986546 http://dx.doi.org/10.1038/s41598-017-13007-w |