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Dynamic annealing in Ge studied by pulsed ion beams

The formation of radiation damage in Ge above room temperature is dominated by complex dynamic annealing processes, involving migration and interaction of ballistically-generated point defects. Here, we study the dynamics of radiation defects in Ge in the temperature range of 100–160 °C under pulsed...

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Detalles Bibliográficos
Autores principales: Wallace, J. B., Bayu Aji, L. B., Shao, L., Kucheyev, S. O.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5640628/
https://www.ncbi.nlm.nih.gov/pubmed/29030564
http://dx.doi.org/10.1038/s41598-017-13161-1