Recent advances in edge illumination x-ray phase-contrast tomography

Edge illumination (EI) is an x-ray phase-contrast imaging technique, exploiting sensitivity to x-ray refraction to visualize features, which are often not detected by conventional absorption-based radiography. The method does not require a high degree of spatial coherence and is achromatic and, ther...

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Detalles Bibliográficos
Autores principales: Zamir, Anna, Hagen, Charlotte, Diemoz, Paul C., Endrizzi, Marco, Vittoria, Fabio, Chen, Yujia, Anastasio, Mark A., Olivo, Alessandro
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Society of Photo-Optical Instrumentation Engineers 2017
Materias:
Review Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5641577/
https://www.ncbi.nlm.nih.gov/pubmed/29057286
http://dx.doi.org/10.1117/1.JMI.4.4.040901

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5641577/
https://www.ncbi.nlm.nih.gov/pubmed/29057286
http://dx.doi.org/10.1117/1.JMI.4.4.040901

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