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Materials analysis and focused ion beam nanofabrication of topological insulator Bi(2)Se(3)
Focused ion beam milling allows manipulation of the shape and size of nanostructures to create geometries potentially useful for opto-electronics, thermoelectrics, and quantum computing. We focus on using the ion beam to control the thickness of Bi(2)Se(3) and to create nanowires from larger structu...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5647386/ https://www.ncbi.nlm.nih.gov/pubmed/29044163 http://dx.doi.org/10.1038/s41598-017-13863-6 |