Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corr...

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Detalles Bibliográficos
Autores principales: Madsen, Jacob, Liu, Pei, Wagner, Jakob B., Hansen, Thomas W., Schiøtz, Jakob
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2017
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5656738/
https://www.ncbi.nlm.nih.gov/pubmed/29104851
http://dx.doi.org/10.1186/s40679-017-0047-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5656738/
https://www.ncbi.nlm.nih.gov/pubmed/29104851
http://dx.doi.org/10.1186/s40679-017-0047-0

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