Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corr...

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Detalles Bibliográficos
Autores principales: Madsen, Jacob, Liu, Pei, Wagner, Jakob B., Hansen, Thomas W., Schiøtz, Jakob
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2017
Materias:
Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5656738/
https://www.ncbi.nlm.nih.gov/pubmed/29104851
http://dx.doi.org/10.1186/s40679-017-0047-0
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author Madsen, Jacob
Liu, Pei
Wagner, Jakob B.
Hansen, Thomas W.
Schiøtz, Jakob
author_facet Madsen, Jacob
Liu, Pei
Wagner, Jakob B.
Hansen, Thomas W.
Schiøtz, Jakob
author_sort Madsen, Jacob
collection PubMed
description Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations. ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (doi:10.1186/s40679-017-0047-0) contains supplementary material, which is available to authorized users.
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spelling pubmed-56567382017-11-01 Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles Madsen, Jacob Liu, Pei Wagner, Jakob B. Hansen, Thomas W. Schiøtz, Jakob Adv Struct Chem Imaging Research Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations. ELECTRONIC SUPPLEMENTARY MATERIAL: The online version of this article (doi:10.1186/s40679-017-0047-0) contains supplementary material, which is available to authorized users. Springer International Publishing 2017-10-25 2017 /pmc/articles/PMC5656738/ /pubmed/29104851 http://dx.doi.org/10.1186/s40679-017-0047-0 Text en © The Author(s) 2017 Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
spellingShingle Research
Madsen, Jacob
Liu, Pei
Wagner, Jakob B.
Hansen, Thomas W.
Schiøtz, Jakob
Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
title Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
title_full Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
title_fullStr Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
title_full_unstemmed Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
title_short Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
title_sort accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
topic Research
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5656738/
https://www.ncbi.nlm.nih.gov/pubmed/29104851
http://dx.doi.org/10.1186/s40679-017-0047-0
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