Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

This study is concerned with backscattered electron scanning electron microscopy (BSE SEM) contrast of complex nanoscaled samples which consist of SiO(2) nanoparticles (NPs) deposited on indium-tin-oxide covered bulk SiO(2) and glassy carbon substrates. BSE SEM contrast of NPs is studied as function...

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Detalles Bibliográficos
Autores principales: Kowoll, Thomas, Müller, Erich, Fritsch-Decker, Susanne, Hettler, Simon, Störmer, Heike, Weiss, Carsten, Gerthsen, Dagmar
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2017
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5661778/
https://www.ncbi.nlm.nih.gov/pubmed/29109816
http://dx.doi.org/10.1155/2017/4907457

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5661778/
https://www.ncbi.nlm.nih.gov/pubmed/29109816
http://dx.doi.org/10.1155/2017/4907457

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