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Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors

By means of advanced numerical simulation, the thermoelectric properties of a Si-quantum dot-based single-electron transistor operating in sequential tunneling regime are investigated in terms of figure of merit, efficiency and power. By taking into account the phonon-induced collisional broadening...

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Autores principales: Talbo, Vincent, Saint-Martin, Jérôme, Retailleau, Sylvie, Dollfus, Philippe
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5666037/
https://www.ncbi.nlm.nih.gov/pubmed/29093549
http://dx.doi.org/10.1038/s41598-017-14009-4
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author Talbo, Vincent
Saint-Martin, Jérôme
Retailleau, Sylvie
Dollfus, Philippe
author_facet Talbo, Vincent
Saint-Martin, Jérôme
Retailleau, Sylvie
Dollfus, Philippe
author_sort Talbo, Vincent
collection PubMed
description By means of advanced numerical simulation, the thermoelectric properties of a Si-quantum dot-based single-electron transistor operating in sequential tunneling regime are investigated in terms of figure of merit, efficiency and power. By taking into account the phonon-induced collisional broadening of energy levels in the quantum dot, both heat and electrical currents are computed in a voltage range beyond the linear response. Using our homemade code consisting in a 3D Poisson-Schrödinger solver and the resolution of the Master equation, the Seebeck coefficient at low bias voltage appears to be material independent and nearly independent on the level broadening, which makes this device promising for metrology applications as a nanoscale standard of Seebeck coefficient. Besides, at higher voltage bias, the non-linear characteristics of the heat current are shown to be related to the multi-level effects. Finally, when considering only the electronic contribution to the thermal conductance, the single-electron transistor operating in generator regime is shown to exhibit very good efficiency at maximum power.
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spelling pubmed-56660372017-11-08 Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors Talbo, Vincent Saint-Martin, Jérôme Retailleau, Sylvie Dollfus, Philippe Sci Rep Article By means of advanced numerical simulation, the thermoelectric properties of a Si-quantum dot-based single-electron transistor operating in sequential tunneling regime are investigated in terms of figure of merit, efficiency and power. By taking into account the phonon-induced collisional broadening of energy levels in the quantum dot, both heat and electrical currents are computed in a voltage range beyond the linear response. Using our homemade code consisting in a 3D Poisson-Schrödinger solver and the resolution of the Master equation, the Seebeck coefficient at low bias voltage appears to be material independent and nearly independent on the level broadening, which makes this device promising for metrology applications as a nanoscale standard of Seebeck coefficient. Besides, at higher voltage bias, the non-linear characteristics of the heat current are shown to be related to the multi-level effects. Finally, when considering only the electronic contribution to the thermal conductance, the single-electron transistor operating in generator regime is shown to exhibit very good efficiency at maximum power. Nature Publishing Group UK 2017-11-01 /pmc/articles/PMC5666037/ /pubmed/29093549 http://dx.doi.org/10.1038/s41598-017-14009-4 Text en © The Author(s) 2017 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Talbo, Vincent
Saint-Martin, Jérôme
Retailleau, Sylvie
Dollfus, Philippe
Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors
title Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors
title_full Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors
title_fullStr Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors
title_full_unstemmed Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors
title_short Non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors
title_sort non-linear effects and thermoelectric efficiency of quantum dot-based single-electron transistors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5666037/
https://www.ncbi.nlm.nih.gov/pubmed/29093549
http://dx.doi.org/10.1038/s41598-017-14009-4
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