Photometric and Colorimetric Assessment of LED Chip Scale Packages by Using a Step-Stress Accelerated Degradation Test (SSADT) Method

By solving the problem of very long test time on reliability qualification for Light-emitting Diode (LED) products, the accelerated degradation test with a thermal overstress at a proper range is regarded as a promising and effective approach. For a comprehensive survey of the application of step-st...

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Detalles Bibliográficos
Autores principales: Qian, Cheng, Fan, Jiajie, Fang, Jiayi, Yu, Chaohua, Ren, Yi, Fan, Xuejun, Zhang, Guoqi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5666987/
https://www.ncbi.nlm.nih.gov/pubmed/29035300
http://dx.doi.org/10.3390/ma10101181

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5666987/
https://www.ncbi.nlm.nih.gov/pubmed/29035300
http://dx.doi.org/10.3390/ma10101181

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