A Practical Example of GaN-LED Failure Cause Analysis by Application of Combined Electron Microscopy Techniques

In this paper, we report a failure case of blue LEDs returned from a field application, and propose a practical way to identify the physical and structural reasons for the observed malfunction by a combination of different electron microscope techniques. Cathodoluminescence imaging and electron beam...

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Detalles Bibliográficos
Autores principales: Meissner, Elke, Haeckel, Maral, Friedrich, Jochen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5667008/
https://www.ncbi.nlm.nih.gov/pubmed/29048343
http://dx.doi.org/10.3390/ma10101202

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5667008/
https://www.ncbi.nlm.nih.gov/pubmed/29048343
http://dx.doi.org/10.3390/ma10101202

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