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A Practical Example of GaN-LED Failure Cause Analysis by Application of Combined Electron Microscopy Techniques
In this paper, we report a failure case of blue LEDs returned from a field application, and propose a practical way to identify the physical and structural reasons for the observed malfunction by a combination of different electron microscope techniques. Cathodoluminescence imaging and electron beam...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5667008/ https://www.ncbi.nlm.nih.gov/pubmed/29048343 http://dx.doi.org/10.3390/ma10101202 |