Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials

In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the f...

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Detalles Bibliográficos
Autores principales: Jiang, Chenchen, Lu, Haojian, Zhang, Hongti, Shen, Yajing, Lu, Yang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi 2017
Materias:
Review Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5676480/
https://www.ncbi.nlm.nih.gov/pubmed/29209445
http://dx.doi.org/10.1155/2017/1985149

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5676480/
https://www.ncbi.nlm.nih.gov/pubmed/29209445
http://dx.doi.org/10.1155/2017/1985149

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