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Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials
In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the f...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Hindawi
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5676480/ https://www.ncbi.nlm.nih.gov/pubmed/29209445 http://dx.doi.org/10.1155/2017/1985149 |