Binary phase masks for easy system alignment and basic aberration sensing with spatial light modulators in STED microscopy

The use of binary phase patterns to improve the integration and optimization of spatial light modulators (SLM) in an imaging system, especially a confocal microscope, is proposed and demonstrated. The phase masks were designed to create point spread functions (PSF), which exhibit specific sensitivit...

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Detalles Bibliográficos
Autores principales: Klauss, André, Conrad, Florian, Hille, Carsten
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5691043/
https://www.ncbi.nlm.nih.gov/pubmed/29147005
http://dx.doi.org/10.1038/s41598-017-15967-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5691043/
https://www.ncbi.nlm.nih.gov/pubmed/29147005
http://dx.doi.org/10.1038/s41598-017-15967-5

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