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Binary phase masks for easy system alignment and basic aberration sensing with spatial light modulators in STED microscopy
The use of binary phase patterns to improve the integration and optimization of spatial light modulators (SLM) in an imaging system, especially a confocal microscope, is proposed and demonstrated. The phase masks were designed to create point spread functions (PSF), which exhibit specific sensitivit...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5691043/ https://www.ncbi.nlm.nih.gov/pubmed/29147005 http://dx.doi.org/10.1038/s41598-017-15967-5 |