Full-wave modeling of broadband near field scanning microwave microscopy

A three-dimensional finite element numerical modeling for the scanning microwave microscopy (SMM) setup is applied to study the full-wave quantification of the local material properties of samples. The modeling takes into account the radiation and scattering losses of the nano-sized probe neglected...

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Detalles Bibliográficos
Autores principales: Wu, Bi-Yi, Sheng, Xin-Qing, Fabregas, Rene, Hao, Yang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5700110/
https://www.ncbi.nlm.nih.gov/pubmed/29167422
http://dx.doi.org/10.1038/s41598-017-13937-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5700110/
https://www.ncbi.nlm.nih.gov/pubmed/29167422
http://dx.doi.org/10.1038/s41598-017-13937-5

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