Cargando…
Full-wave modeling of broadband near field scanning microwave microscopy
A three-dimensional finite element numerical modeling for the scanning microwave microscopy (SMM) setup is applied to study the full-wave quantification of the local material properties of samples. The modeling takes into account the radiation and scattering losses of the nano-sized probe neglected...
| Autores principales: | , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2017
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5700110/ https://www.ncbi.nlm.nih.gov/pubmed/29167422 http://dx.doi.org/10.1038/s41598-017-13937-5 |