The electron-phonon interaction at deep Bi(2)Te(3)-semiconductor interfaces from Brillouin light scattering

It is shown that the electron-phonon interaction at a conducting interface between a topological insulator thin film and a semiconductor substrate can be directly probed by means of high-resolution Brillouin light scattering (BLS). The observation of Kohn anomalies in the surface phonon dispersion c...

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Detalles Bibliográficos
Autores principales: Wiesner, M., Trzaskowska, A., Mroz, B., Charpentier, S., Wang, S., Song, Y., Lombardi, F., Lucignano, P., Benedek, G., Campi, D., Bernasconi, M., Guinea, F., Tagliacozzo, A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5703879/
https://www.ncbi.nlm.nih.gov/pubmed/29180657
http://dx.doi.org/10.1038/s41598-017-16313-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5703879/
https://www.ncbi.nlm.nih.gov/pubmed/29180657
http://dx.doi.org/10.1038/s41598-017-16313-5

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