Probing spatial heterogeneity in silicon thin films by Raman spectroscopy

Raman spectroscopy is a powerful technique for revealing spatial heterogeneity in solid-state structures but heretofore has not been able to measure spectra from multiple positions on a sample within a short time. Here, we report a novel Raman spectroscopy approach to study the spatial heterogeneity...

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Detalles Bibliográficos
Autores principales: Yamazaki, Hideyuki, Koike, Mitsuo, Saitoh, Masumi, Tomita, Mitsuhiro, Yokogawa, Ryo, Sawamoto, Naomi, Tomita, Motohiro, Kosemura, Daisuke, Ogura, Atsushi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5707398/
https://www.ncbi.nlm.nih.gov/pubmed/29185465
http://dx.doi.org/10.1038/s41598-017-16724-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5707398/
https://www.ncbi.nlm.nih.gov/pubmed/29185465
http://dx.doi.org/10.1038/s41598-017-16724-4

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