Solution Based Methods for the Fabrication of Carbon Nanotube Modified Atomic Force Microscopy Probes

High aspect ratio carbon nanotubes are ideal candidates to improve the resolution and lifetime of atomic force microscopy (AFM) probes. Here, we present simple methods for the preparation of carbon nanotube modified AFM probes utilising solvent evaporation or dielectrophoresis. Scanning electron mic...

Descripción completa

Detalles Bibliográficos
Autores principales: Slattery, Ashley D., Shearer, Cameron J., Shapter, Joseph G., Quinton, Jamie S., Gibson, Christopher T.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5707563/
https://www.ncbi.nlm.nih.gov/pubmed/29068385
http://dx.doi.org/10.3390/nano7110346

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5707563/
https://www.ncbi.nlm.nih.gov/pubmed/29068385
http://dx.doi.org/10.3390/nano7110346

Ejemplares similares