Broad modulus range nanomechanical mapping by magnetic-drive soft probes

Stiffness matching between the probe and deformed portion of the sample in piezo-drive peak force modulation atomic force microscopy (AFM) limits the modulus measurement range of single probes. Here we develop a magnetic drive peak force modulation AFM to broaden the dynamic range of the probe with...

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Detalles Bibliográficos
Autores principales: Meng, Xianghe, Zhang, Hao, Song, Jianmin, Fan, Xinjian, Sun, Lining, Xie, Hui
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5717272/
https://www.ncbi.nlm.nih.gov/pubmed/29208894
http://dx.doi.org/10.1038/s41467-017-02032-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5717272/
https://www.ncbi.nlm.nih.gov/pubmed/29208894
http://dx.doi.org/10.1038/s41467-017-02032-y

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