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Broad modulus range nanomechanical mapping by magnetic-drive soft probes
Stiffness matching between the probe and deformed portion of the sample in piezo-drive peak force modulation atomic force microscopy (AFM) limits the modulus measurement range of single probes. Here we develop a magnetic drive peak force modulation AFM to broaden the dynamic range of the probe with...
Autores principales: | Meng, Xianghe, Zhang, Hao, Song, Jianmin, Fan, Xinjian, Sun, Lining, Xie, Hui |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2017
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5717272/ https://www.ncbi.nlm.nih.gov/pubmed/29208894 http://dx.doi.org/10.1038/s41467-017-02032-y |
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