Study of DQE dependence with beam quality on GE Essential mammography flat panel

This paper deals with the analysis of the behavior of objective image quality parameters for the new GE Senographe Essential FFDM system, in particular its dependence with beam quality. The detector consists of an indirect conversion a‐Si flat panel coupled to a CsI:Tl scintillator. The system under...

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Detalles Bibliográficos
Autores principales: García‐Mollá, Rafael, Linares Rafael Ayala, Rafael
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2010
Materias:
Medical Imaging
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5718588/
https://www.ncbi.nlm.nih.gov/pubmed/21330969
http://dx.doi.org/10.1120/jacmp.v12i1.3176

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5718588/
https://www.ncbi.nlm.nih.gov/pubmed/21330969
http://dx.doi.org/10.1120/jacmp.v12i1.3176

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