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Study of DQE dependence with beam quality on GE Essential mammography flat panel
This paper deals with the analysis of the behavior of objective image quality parameters for the new GE Senographe Essential FFDM system, in particular its dependence with beam quality. The detector consists of an indirect conversion a‐Si flat panel coupled to a CsI:Tl scintillator. The system under...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
John Wiley and Sons Inc.
2010
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5718588/ https://www.ncbi.nlm.nih.gov/pubmed/21330969 http://dx.doi.org/10.1120/jacmp.v12i1.3176 |