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Proton dose distribution measurements using a MOSFET detector with a simple dose‐weighted correction method for LET effects
We experimentally evaluated the proton beam dose reproducibility, sensitivity, angular dependence and depth‐dose relationships for a new Metal Oxide Semiconductor Field Effect Transistor (MOSFET) detector. The detector was fabricated with a thinner oxide layer and was operated at high‐bias voltages....
Autores principales: | Kohno, Ryosuke, Hotta, Kenji, Matsuura, Taeko, Matsubara, Kana, Nishioka, Shie, Nishio, Teiji, Kawashima, Mitsuhiko, Ogino, Takashi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
John Wiley and Sons Inc.
2011
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5718688/ https://www.ncbi.nlm.nih.gov/pubmed/21587191 http://dx.doi.org/10.1120/jacmp.v12i2.3431 |
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