Automated Interpretation and Extraction of Topographic Information from Time of Flight Secondary Ion Mass Spectrometry Data

Time of flight secondary ion mass spectrometry (ToF-SIMS) is a powerful surface-sensitive characterization tool allowing the imaging of chemical properties over a wide range of organic and inorganic material systems. This technique allows precise studies of chemical composition with sub-100-nm later...

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Detalles Bibliográficos
Autores principales: Ievlev, Anton V., Belianinov, Alexei, Jesse, Stephen, Allison, David P., Doktycz, Mitchel J., Retterer, Scott T., Kalinin, Sergei V., Ovchinnikova, Olga S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5719033/
https://www.ncbi.nlm.nih.gov/pubmed/29213083
http://dx.doi.org/10.1038/s41598-017-17049-y

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5719033/
https://www.ncbi.nlm.nih.gov/pubmed/29213083
http://dx.doi.org/10.1038/s41598-017-17049-y

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