Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy

[Image: see text] High-resolution atomic force microscopy is used to map the surface charge on the basal planes of kaolinite nanoparticles in an ambient solution of variable pH and NaCl or CaCl(2) concentration. Using DLVO theory with charge regulation, we determine from the measured force–distance...

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Detalles Bibliográficos
Autores principales: Kumar, N., Andersson, M. P., van den Ende, D., Mugele, F., Siretanu, I.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2017
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5738629/
https://www.ncbi.nlm.nih.gov/pubmed/29140711
http://dx.doi.org/10.1021/acs.langmuir.7b03153

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5738629/
https://www.ncbi.nlm.nih.gov/pubmed/29140711
http://dx.doi.org/10.1021/acs.langmuir.7b03153

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