Cargando…
Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy
[Image: see text] High-resolution atomic force microscopy is used to map the surface charge on the basal planes of kaolinite nanoparticles in an ambient solution of variable pH and NaCl or CaCl(2) concentration. Using DLVO theory with charge regulation, we determine from the measured force–distance...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American
Chemical Society
2017
|
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5738629/ https://www.ncbi.nlm.nih.gov/pubmed/29140711 http://dx.doi.org/10.1021/acs.langmuir.7b03153 |