An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT

Electrical capacitance tomography (ECT) is a promising imaging technology of permittivity distributions in multiphase flow. To reduce the effect of charging phenomenon on ECT measurement, an improved extreme learning machine method combined with adaptive soft-thresholding (AST-ELM) is presented and...

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Detalles Bibliográficos
Autores principales: Wang, Xiaoxin, Hu, Hongli, Jia, Huiqin, Tang, Kaihao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2017
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5750568/
https://www.ncbi.nlm.nih.gov/pubmed/29232850
http://dx.doi.org/10.3390/s17122863

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5750568/
https://www.ncbi.nlm.nih.gov/pubmed/29232850
http://dx.doi.org/10.3390/s17122863

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