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An AST-ELM Method for Eliminating the Influence of Charging Phenomenon on ECT
Electrical capacitance tomography (ECT) is a promising imaging technology of permittivity distributions in multiphase flow. To reduce the effect of charging phenomenon on ECT measurement, an improved extreme learning machine method combined with adaptive soft-thresholding (AST-ELM) is presented and...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2017
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5750568/ https://www.ncbi.nlm.nih.gov/pubmed/29232850 http://dx.doi.org/10.3390/s17122863 |